Improve the Height Measurement Accuracy in Three-dimensional Imaging Altimeter Using Nadir Interferometric Phase

Miao Xiangying, Miao Hongli, Zhang Xudong, Huang Xiafeng, Wang Guizhong

Remote Sensing Technology and Application ›› 2018, Vol. 33 ›› Issue (5) : 866-872.

Remote Sensing Technology and Application ›› 2018, Vol. 33 ›› Issue (5) : 866-872. DOI: 10.11873/j.issn.1004-0323.2018.5.0866

Improve the Height Measurement Accuracy in Three-dimensional Imaging Altimeter Using Nadir Interferometric Phase

    {{javascript:window.custom_author_en_index=0;}}
  • {{article.zuoZhe_EN}}
Author information +
History +

HeighLight

{{article.keyPoints_en}}

Abstract

{{article.zhaiyao_en}}

Key words

QR code of this article

Cite this article

Download Citations
{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2018, 33(5): 866-872 https://doi.org/10.11873/j.issn.1004-0323.2018.5.0866

References

References

{{article.reference}}

Funding

RIGHTS & PERMISSIONS

{{article.copyrightStatement_en}}
{{article.copyrightLicense_en}}

Accesses

Citation

Detail

Sections
Recommended

/